X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
Produktnummer:
1850b78c943f624940818b0df16fbb7be3
Autor: | Schmidbauer, Martin |
---|---|
Themengebiete: | Mesoscopic systems Self-organized growth Semiconductor Semiconductors nanostructures X-ray diffuse scattering quantum dot scattering |
Veröffentlichungsdatum: | 01.12.2010 |
EAN: | 9783642057694 |
Sprache: | Englisch |
Seitenzahl: | 204 |
Produktart: | Kartoniert / Broschiert |
Verlag: | Springer Berlin |
Produktinformationen "X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures"
This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.

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