Produktnummer:
181f44c20dae16443cb7eb2b7cb6a7cee7
| Themengebiete: | Analytics Big data Data-driven Dependability Reliability |
|---|---|
| Veröffentlichungsdatum: | 26.07.2022 |
| EAN: | 9783031020629 |
| Sprache: | Englisch |
| Seitenzahl: | 433 |
| Produktart: | Gebunden |
| Herausgeber: | Athreya, Arjun Bagchi, Saurabh Di Martino, Catello Pattabiraman, Karthik Wang, Long |
| Verlag: | Springer International Publishing |
| Untertitel: | Approaching System Dependability from Data, System and Analytics Perspectives |
Produktinformationen "System Dependability and Analytics"
This book comprises chapters authored by experts who are professors and researchers in internationally recognized universities and research institutions. The book presents the results of research and descriptions of real-world systems, services, and technologies. Reading this book, researchers, professional practitioners, and graduate students will gain a clear vision on the state of the art of the research and real-world practice on system dependability and analytics.The book is published in honor of Professor Ravishankar K. Iyer, the George and Ann Fisher Distinguished Professor in the Department of Electrical and Computer Engineering at the University of Illinois at Urbana-Champaign (UIUC), Urbana, Illinois. Professor Iyer is ACM Fellow, IEEE Fellow, AAAS Fellow, and served as Interim Vice Chancellor of UIUC for research during 2008–2011. The book contains chapters written by many of his former students.
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