Zum Hauptinhalt springen Zur Suche springen Zur Hauptnavigation springen

Um unseren Shop in vollem Umfang nutzen zu können, empfehlen wir Ihnen Javascript in Ihrem Browser zu aktivieren.

Haben Sie Fragen? Einfach anrufen, wir helfen gerne: Tel. 089/210233-0

oder besuchen Sie unser Ladengeschäft in der Pacellistraße 5 (Maxburg) 80333 München

+++ Versandkostenfreie Lieferung innerhalb Deutschlands

Haben Sie Fragen? Tel. 089/210233-0

Ihr Konto

Anmelden

oder registrieren

Übersicht Persönliches Profil Adressen Zahlungsarten Bestellungen Kreditkarten

JURISTISCHE LITERATUR

STUDIENLITERATUR

INFORMATIONEN

Wichtige Studienliteratur

Prüfungszugelassene Titel

AGB

Datenschutz

Kontakt

Impressum

Über Uns

Service

Home

JURISTISCHE LITERATUR
STUDIENLITERATUR
DATENBANKEN
BEHÖRDEN
BECK ONLINE
INFORMATIONEN

Zu "Reliability" wurden 214 Produkte gefunden

Produkte filtern

Nur Neuerscheinungen

APRESS (1)
De Gruyter (2)
Deutsche Gesellschaft für Zerstörungsfreie Prüfung (4)
KIT Scientific Publishing (2)
Logos Berlin (1)
Palgrave Macmillan UK (1)
Shaker (2)
Springer Basel (1)
Springer Berlin (16)
Springer Fachmedien Wiesbaden GmbH (2)
Springer International Publishing (94)
Springer Italia (2)
Springer London (28)
Springer Netherland (6)
Springer Singapore (40)
Springer US (8)
Technische Uni Dresden (2)
tredition (1)
VS Verlag für Sozialwissenschaften (1)

Buch (1)
CDROM (3)
Gebunden (86)
Kartoniert / Broschiert (109)
Kassette / Medienmix z.B. Audio und Buch (8)
Unbekannt (7)

Abdul Sani, Amiril Sahab Osman Zahid, Muhammed Nafis Mohamad Yasin, Mohamad Rusydi Ismail, Siti Zubaidah Mohd Zawawi, Mohd Zairulnizam Abdul Manaf, Ahmad Rosli Mohd Saffe, Siti Nadiah Abd Aziz, Radhiyah Mohd Turan, Faiz (2)
Al-Shaer, Ehab Ou, Xinming Xie, Geoffrey (2)
Anand, Adarsh Ram, Mangey (1)
Aslett, Louis J. M. Coolen, Frank P. A. De Bock, Jasper (1)
Ausnit-Hood, Christine Johnson, Kent A. Pettit IV, Robert G. Opdahl, Steven B. (1)
Ball, Andrew D. Ouyang, Huajiang Sinha, Jyoti K. Wang, Zuolu (4)
Blefari-Melazzi, Nicola Bianchi, Giuseppe Salgarelli, Luca (1)
Bozzano, Marco Papadopoulos, Yiannis (1)
Chamberlain, Roger Taha, Walid Törngren, Martin (1)
Chen, Bingyan Liang, Xiaoxia Lin, Tian Ran Chu, Fulei Ball, Andrew D. (1)
De Cursi, José Eduardo Souza (2)
Ehrenberger, Wolfgang (1)
Erto, Pasquale (1)
Forshaw, Matthew Gilly, Katja Knottenbelt, William Thomas, Nigel (1)
Grimvall, Göran Holmgren, Åke Jacobsson, Per Thedéen, Torbjörn (2)
Grossmann, Günter Zardini, Christian (2)
Gupta, Vijay Kumar Varde, Prabhakar V. Kankar, P. K. Joshi, Narendra (2)
Holmberg, Kenneth Adgar, Adam Arnaiz, Aitor Jantunen, Erkki Mascolo, Julien Mekid, Samir (2)
Huang, Zhiqiu Sun, Xingming Luo, Junzhou Wang, Jian (1)
Ibne Hossain, Niamat Ullah (2)
Ishibashi, Koichiro Osada, Kenichi (2)
Jäger, Wolfram (2)
Kapur, P. K. Klochkov, Yury Verma, Ajit Kumar Singh, Gurinder (2)
Kapur, P. K. Singh, Ompal Khatri, Sunil Kumar Verma, Ajit Kumar (2)
Karanki, Durga Rao (2)
Karner, Michael Peltola, Johannes Jerne, Michael Kulas, Lukas Priller, Peter (2)
Khabbaz, Hadi Rujikiatkamjorn, Cholachat Parsa-Pajouh, Ali (1)
Khabbaz, Hadi Rujikiatkamjorn, Cholachat Tamadon, Mehdi Parsa-Pajouh, Ali (2)
Kumar, Amit Ram, Mangey (1)
Kumar, Pardeep Singh, Prabhishek Diwakar, Manoj Garg, Deepak (1)
Kumar, Somesh Arnold, Barry C. Shimizu, Kunio Laha, Arnab Kumar (1)
Kumar, Uday Ahmadi, Alireza Verma, Ajit Kumar Varde, Prabhakar (2)
Kyrylenko, Olexander Denysiuk, Serhii Derevianko, Denys Blinov, Ihor Zaitsev, Ievgen Zaporozhets, Artur (2)
Lisnianski, Anatoly Frenkel, Ilia Karagrigoriou, Alex (2)
Liu, Tongtong Zhang, Fan Huang, Shiqing Wang, Jingjing Gu, Fengshou (1)
Liu, Yu Wang, Dong Mi, Jinhua Li, He (2)
Luo, Min Zhang, Liang-Jie (1)
Mahmood, Zaigham (2)
Mathew, Ribu Ajayan, J. (1)
Mishra, Sukumar Sood, Yog Raj Tomar, Anuradha (2)
Misra, Sudip Misra, Subhas Chandra Woungang, Isaac (2)
Murray, Alan T. Grubesic, Tony (2)
Nemeth, Christopher P. Hollnagel, Erik (2)
Osaki, S. Hatoyama, Y. (1)
Osman Zahid, Muhammed Nafis Abdul Sani, Amiril Sahab Mohamad Yasin, Mohamad Rusydi Ismail, Zulhelmi Che Lah, Nurul Akmal Mohd Turan, Faiz (2)
Pfitzmann, Andreas Raubold, Eckart (1)
Pham, Hoang (4)
Rackwitz, Rüdiger Thoft-Christensen, Palle (1)
Seetharamu, S. Jagadish, Thimmarayappa Malagi, Ravindra (1)
Shin, Sung Y. Gantenbein, Rex Kuo, Tei-Wei Hong, Jiman (1)
Shu, Xiong Zhu, Yun Chen, Bingyan Zou, Hongxiang (2)
Slavinska, Olena Danchuk, Viktor Kunytska, Olga Hulchak, Oksana (1)
Sridhar, Narasi (1)
van Driel, W.D. Fan, X.J. (2)
Varde, Prabhakar V. Kumar, Manoj Agarwal, Mayank (2)
Varde, Prabhakar V. Vinod, Gopika Joshi, N. S. (1)
Wang, Long Pattabiraman, Karthik Di Martino, Catello Athreya, Arjun Bagchi, Saurabh (2)
Wang, Zuolu Zhang, Kai Feng, Ke Xu, Yuandong Yang, Wenxian (1)
Wei, Kexiang Yang, Wenxian Dai, Juchuan Chen, Bingyan (2)
Zamojski, Wojciech Mazurkiewicz, Jacek Sugier, Jaroslaw Walkowiak, Tomasz Kacprzyk, Janusz (14)
Zhang, Hao Ji, Yongjian Liu, Tongtong Sun, Xiuquan Ball, Andrew David (2)
Zhao, Qian Qian Chung, Il Han Zheng, Junjun Kim, Jongwoon (1)

Birolini, Alessandro (1)
Chapelle, Dominique Bathe, Klaus-Jurgen (2)
Courtois, Pierre-Jacques (2)
Crespo Márquez, Adolfo (2)
Demel, Johannes (1)
Elattar, Mohammad (1)
Eloff, Jan Bihina Bella, Madeleine (2)
Finkelstein, Maxim (2)
Gan, Chong Leong Huang, Chen Yu (2)
Girardin, Valérie Limnios, Nikolaos (2)
Gong, Chao (2)
Haarla, Liisa Koskinen, Mikko Hirvonen, Ritva Labeau, Pierre-Etienne (2)
Halsey, Mike (1)
Hartmann, Raik (1)
Huang, Xiaowei Jin, Gaojie Ruan, Wenjie (2)
Hyslop, Maitland (2)
Häuberer, Julia (1)
Kaminski, Marcin Marek (2)
Kang, Rui (2)
Karim, Md. Rezaul Islam, M. Ataharul (1)
Kastensmidt, Fernanda Lima Reis, Ricardo (2)
Kelly, Dana Smith, Curtis (2)
Kochs, Hans-Dieter (2)
Krini, Ossmane (1)
Krishnaswamy, Smita Markov, Igor L. Hayes, John P. (2)
Lau, John Fan, Xuejun (1)
Leimeister, Mareike (2)
Leira, Bernt J. (1)
Lisnianski, Anatoly Frenkel, Ilia Khvatskin, Lev (2)
Liu, Leibo Wei, Shaojun Zhu, Jianfeng Deng, Chenchen (2)
Ma, Ke (2)
Mackil (1)
Manzini, Riccardo Regattieri, Alberto Pham, Hoang Ferrari, Emilio (2)
Mizutani, Satoshi Zhao, Xufeng Nakagawa, Toshio (2)
Mukherjee, S P Sinha, Bikas K Chattopadhyay, Asis Kumar (2)
Murali, Srinivasan (2)
Mürken, Michael (1)
Nakagawa, Toshio (4)
Navarro, Jorge (2)
Nguyen, Tuan Tran (1)
Pargmann, Julia Berding, Florian (1)
Peng, Rui Zhai, Qingqing Yang, Jun (2)
Popping, Roel (1)
Qaisar, Muhammad Umar Farooq Yuan, Weijie Bellavista, Paolo Tabassum, Hina (2)
Rahman, Anisur Chattopadhyay, Gopinath (1)
Ren, Yi Qian, Cheng Yang, Dezhen Feng, Qiang Sun, Bo Wang, Zili (2)
Richter, Detlev (2)
Riezler, Stefan Hagmann, Michael (1)
Salehi, Hamidreza (1)
Schagaev, Igor Gutknecht, Jürg (1)
Soliman, Mohammad (1)
Souza de Cursi, Eduardo (2)
Stagars, Manuel (1)
Stanisavljevic, Miloš Schmid, Alexandre Leblebici, Yusuf (2)
Störmer, Horand (1)
Sánchez-Silva, Mauricio Klutke, Georgia-Ann (2)
Tamura, Yoshinobu Yamada, Shigeru (1)
Thoft-Cristensen, P. Baker, M.J. (1)
Vaupel, Robert (1)
Xiao, Liang Yang, Helin Zhuang, Weihua Min, Minghui (2)
Yazdi, Mohammad (2)
Zhang, Yilei Lyu, Michael R. (1)

1984 (1)
1985 (1)
1990 (1)
1991 (1)
1992 (1)
1997 (1)
1998 (1)
2002 (1)
2005 (1)
2006 (1)
2007 (1)
2008 (1)
2009 (1)
2010 (1)
2011 (1)
2012 (1)
2013 (1)
2014 (1)
2015 (1)
2016 (1)
2017 (1)
2018 (1)
2019 (1)
2023 (2)
2024 (2)
2025 (2)

Deutsch (4)
Englisch (210)

HOME

1
2
3
4
5

Vorderes Coverbild Troubleshooting and Supporting Windows 11

Troubleshooting and Supporting Windows 11

48,14 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Systems Reliability Engineering

Systems Reliability Engineering

169,95 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild High Availability and Scalability of Mainframe Environments using System z and z/OS as example

High Availability and Scalability of Mainframe Environments using System z and z/OS as example

60,00 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Intelligent Secure Trustable Things

Intelligent Secure Trustable Things

42,79 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Fatigue, Durability, and Fracture Mechanics

Fatigue, Durability, and Fracture Mechanics

160,49 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Reliability and Risk Assessment in Engineering

Reliability and Risk Assessment in Engineering

246,09 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Long Term Warranty and After Sales Service

Long Term Warranty and After Sales Service

69,54 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Power Electronics for the Next Generation Wind Turbine System

Power Electronics for the Next Generation Wind Turbine System

106,99 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Contemporary Complex Systems and Their Dependability

Contemporary Complex Systems and Their Dependability

160,49 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Theory and Applications of Dependable Computer Systems

Theory and Applications of Dependable Computer Systems

160,49 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild System Performance and Management Analytics

System Performance and Management Analytics

106,99 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Cloud Computing and Security

Cloud Computing and Security

53,49 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Automated Security Management

Automated Security Management

53,49 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Complex Systems and Dependability

Complex Systems and Dependability

106,99 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Introduction to System Reliability Theory

Introduction to System Reliability Theory

80,24 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Advancing Resilient Performance

Advancing Resilient Performance

128,39 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Statistical Methods in Social Science Research

Statistical Methods in Social Science Research

85,59 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Data Analytics for Supply Chain Networks

Data Analytics for Supply Chain Networks

171,19 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Theory and Engineering of Complex Systems and Dependability

Theory and Engineering of Complex Systems and Dependability

160,49 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Enabling Industry 4.0 through Advances in Manufacturing and Materials

Enabling Industry 4.0 through Advances in Manufacturing and Materials

353,09 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Software Failure Investigation

Software Failure Investigation

106,99 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Belief Reliability Theory and Methodology

Belief Reliability Theory and Methodology

181,89 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Frontiers of Performability Engineering

Frontiers of Performability Engineering

213,99 €*

Preise inkl. MwSt. zzgl. Versandkosten

Vorderes Coverbild Solid State Lighting Reliability

Solid State Lighting Reliability

213,99 €*

Preise inkl. MwSt. zzgl. Versandkosten

1
2
3
4
5

Buchhandlung Georg Blendl GmbH & Co KG
Buchhandlung und Antiquariat für Rechts- und Staatswissenschaften
Pacellistraße 5 (Maxburg)
80333 München
+049 89 210 233-0
+049 89 210 233-44
info@BGB-Online.de
ww.BGB-Online.de

Öffnungszeiten:
Montag bis Freitag
8:15 bis 18:00 Uhr

Samstag geschlossen

Online 24/7

JURISTISCHE LITERATUR
STUDIENLITERATUR
DATENBANKEN
BEHÖRDEN
BECK ONLINE

AGB
Datenschutz
Kontakt
Impressum
Über Uns
Service

Diese Website verwendet Cookies, um eine bestmögliche Erfahrung bieten zu können. Mehr Informationen ...