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Recent Advances in PMOS Negative Bias Temperature Instability
160,49 €*
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Reliability of high-k / metal gate field-effect transistors considering circuit operational constraints
29,99 €*
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Development of HfO2-Based Ferroelectric Memories for Future CMOS Technology Nodes
49,99 €*
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Recent Advances in PMOS Negative Bias Temperature Instability
160,49 €*
Preise inkl. MwSt. zzgl. Versandkosten