Produktnummer:
18d08a8179f3794c8c9ea7a66b778b8edd
| Themengebiete: | Elektronenemission Elektronenspektroskopie Mikroskopie Proton-induced electron emission Scanning microscopy Scanningmikroskopie Secondary electron emission electron electron spectroscopy electron yield |
|---|---|
| Veröffentlichungsdatum: | 03.10.2013 |
| EAN: | 9783662149812 |
| Sprache: | Englisch |
| Seitenzahl: | 223 |
| Produktart: | Kartoniert / Broschiert |
| Verlag: | Springer Berlin |
Produktinformationen "Particle Induced Electron Emission II"
Electron emission is a fundamental phenomenon which accompanies most interactions of energetic particles with solid surfaces. Not only is it a special effect which for almost ninety years has attracted the interest of physicists, but it is also of acute importance in such fields as radiation effects and transport phenomena in solids (e.g., radiation biology), plasma-surface interactions, microtechnology, surface analysis, ion microscopies, particle detector development and others. While Volume I emphasizes the theoretical description of the mechanisms of electron emission, this volume reviews modern experimental trends and aspects of the phenomenon, e.g., kinetic electron emission from massive solids and from thin foils under bombardment with positive, negative, and neutral particles, and the measurement of electron statistics in connection with potential and kinetic emission due to slow singly and multiply charged projectiles.
Sie möchten lieber vor Ort einkaufen?
Sie haben Fragen zu diesem oder anderen Produkten oder möchten einfach gerne analog im Laden stöbern? Wir sind gerne für Sie da und beraten Sie auch telefonisch.
Juristische Fachbuchhandlung
Georg Blendl
Parcellistraße 5 (Maxburg)
8033 München
Montag - Freitag: 8:15 -18 Uhr
Samstags geschlossen