Electron Energy-Loss Spectroscopy in the Electron Microscope
Produktnummer:
18202fbfde5e6342cab1d3b9f138d290db
| Autor: | Egerton, R.F. |
|---|---|
| Themengebiete: | Analytical Electron Microscopy book EELS materials science book Inelastic scattering of electrons Transmission Electron Microscopy book computing partial ionization cross-sections image-filtering systems spectrum deconvolution |
| Veröffentlichungsdatum: | 29.07.2011 |
| EAN: | 9781441995827 |
| Auflage: | 3 |
| Sprache: | Englisch |
| Seitenzahl: | 491 |
| Produktart: | Gebunden |
| Verlag: | Springer US |
Produktinformationen "Electron Energy-Loss Spectroscopy in the Electron Microscope"
Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data.
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