Design for Manufacturability and Yield for Nano-Scale CMOS
Produktnummer:
1857243c03bee141f28a398fee34c60760
| Autor: | Chiang, Charles Kawa, Jamil |
|---|---|
| Themengebiete: | CAD (Computer aided design) CAE (Computer aided engineering) CMOS Standard classification computer-aided design (CAD) computer-aided engineering (CAE) design development integrated circuit |
| Veröffentlichungsdatum: | 22.11.2010 |
| EAN: | 9789048173037 |
| Sprache: | Englisch |
| Seitenzahl: | 255 |
| Produktart: | Kartoniert / Broschiert |
| Verlag: | Springer Netherland |
Produktinformationen "Design for Manufacturability and Yield for Nano-Scale CMOS"
Manufacturability and yield are no longer a fabrication, packaging, and test concerns. They are aspects that have to be designed in, and they are everybody’s responsibility. Design for Manufacturability and Yield for Nano-Scale CMOS walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process and how to address each aspect at the proper design step starting with the layout of standard cells and how to yield-grade libraries for critical area and lithography artifacts through place and route, CMP model based simulation and dummy-fill insertion, and through statistical timing closure of the design. It alerts the designer to the pitfalls to watch for and to the good practices that can enhance a design’s manufacturability and yield. A must read book for the serious designer.
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