Software Reliability Growth Models
Produktnummer:
189686145e79e54f9bb6786542806b6d1e
Autor: | Bhalerao, Nileema N. Hanagal, David D. |
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Themengebiete: | delayed s-shaped curve extended inverse Weibull fault content rate function hazard rate imperfect debugging inverse Weibull mean value function model selection criteria non-homogeneous Poisson process predictive risk ratio |
Veröffentlichungsdatum: | 27.02.2021 |
EAN: | 9789811600241 |
Sprache: | Englisch |
Seitenzahl: | 104 |
Produktart: | Gebunden |
Verlag: | Springer Singapore |
Produktinformationen "Software Reliability Growth Models"
This book presents the basic concepts of software reliability growth models (SRGMs), ranging from fundamental to advanced level. It discusses SRGM based on the non-homogeneous Poisson process (NHPP), which has been a quite successful tool in practical software reliability engineering. These models consider the debugging process as a counting process characterized by its mean value function. Model parameters have been estimated by using either the maximum likelihood method or regression. NHPP SRGMs based on inverse Weibull, generalized inverse Weibull, extended inverse Weibull, generalized extended inverse Weibull, and delayed S-shaped have been focused upon. Review of literature on SRGM has been included from the scratch to recent developments, applicable in artificial neural networks, machine learning, artificial intelligence, data-driven approaches, fault-detection, fault-correction processes, and also in random environmental conditions. This book is designed for practitioners and researchers at all levels of competency, and also targets groups who need information on software reliability engineering.

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