Physical Principles of Electron Microscopy
Produktnummer:
183e63632bde42478e92d627dc47c91f45
| Autor: | Egerton, R.F. |
|---|---|
| Themengebiete: | Microscopy Monochromator Transmission X-ray Emission Spectroscopy crystal diffraction electron microscope electron microscopy nanotechnology optical microscope |
| Veröffentlichungsdatum: | 03.08.2005 |
| EAN: | 9780387258003 |
| Sprache: | Englisch |
| Seitenzahl: | 202 |
| Produktart: | Gebunden |
| Verlag: | Springer US |
| Untertitel: | An Introduction to TEM, SEM, and AEM |
Produktinformationen "Physical Principles of Electron Microscopy"
Scanning and stationary-beam electron microscopes have become indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book provides an introduction to the theory and current practice of electron microscopy, aimed primarily at undergraduates who need to learn how the basic principles of physics are applied in an important area of science and technology that has contributed greatly to our knowledge of life processes and "inner space." Less technical but broader in scope than other microscopy textbooks, Physical Principles of Electron Microscopy is appropriate for undergraduates and technologists with limited mathematical training. However, it will be equally valuable for for graduate students, university teachers and researchers who need a concise text that deals with the basic principles of microscopy.
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