Produktnummer:
18286fa30b066a43979068a20365501c76
Themengebiete: | Electron Back-scattered Diffraction Electron Channeling Contrast Imaging Microstructure Microtexture Texture |
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Veröffentlichungsdatum: | 02.08.2025 |
EAN: | 9789819653461 |
Sprache: | Englisch |
Seitenzahl: | 453 |
Produktart: | Unbekannt |
Herausgeber: | Field, David P. Suwas, Satyam |
Verlag: | Springer Singapore |
Untertitel: | Measurements, Analyses, and Application |
Produktinformationen "Advances in Texture, Microtexture, and Allied Techniques"
This book presents the fundamentals of texture and microtexture with the latest developments in the field and relates the same for different materials and processes. Crystallographic phase and orientation define the anisotropy of crystalline materials. In polycrystalline materials, the preferred crystallographic orientation of grain distributions, also known as (crystallographic) texture, controls the properties of materials. The evaluation of texture has been traditionally carried out by X-ray diffraction and neutron diffraction. In recent times, microtexture-based techniques have been widely used not only to examine the crystallographic texture but also to investigate the micro-mechanisms controlling the development of texture and microstructure. It has, therefore, become almost mandatory to re-visit the physical phenomenon associated with materials from the viewpoint of microtexture. The individual chapters have been written by the renowned scientists working in the respective domain. The book can be a valuable reference for researchers and professionals interested in fundamentals of texture and microtexture and allied fields.

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